{"created":"2023-05-15T09:36:30.776870+00:00","id":12242,"links":{},"metadata":{"_buckets":{"deposit":"d3f7d5f8-a603-4c9d-8180-8675f46cccbc"},"_deposit":{"created_by":4,"id":"12242","owners":[4],"pid":{"revision_id":0,"type":"depid","value":"12242"},"status":"published"},"_oai":{"id":"oai:nara-edu.repo.nii.ac.jp:00012242","sets":["1292:1298:1420"]},"author_link":["51666","51668","51665","51670","51669","51667"],"item_3_alternative_title_18":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"Verification Method of the Complete Paleodose Zeroing in TL Fault Dating  －From the Experimental Investigation of the Instantaneous Heating Effect on TL Intensity－"}]},"item_3_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2001-10-15","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicPageEnd":"37","bibliographicPageStart":"31","bibliographicVolumeNumber":"50","bibliographic_titles":[{"bibliographic_title":"奈良教育大学紀要. 自然科学"}]}]},"item_3_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We have investigated an elementary process attributable to heat in recovery of radiation damage at the time of fault movement, searching the decrease of thermoluminescence (TL) intensities for quartz grains heated by the instantaneous thermal contact and being of 105～150μm diameter. As a result of the experiments, we have found the following facts: (1) It cannot be always expected that radiation damage is completely recovered at just an elevated temperature of each sample heated by the instantaneous thermal contact. The complete zeroing is detectable in the lower temperature range. (2) If the perfect ED plateau is detected, then it can be verified that the paleodose zeroing at the time of fault movement must be complete. (3) Executing the ED plateau test, we can obtain one of the following informations : i ) If the ED plateau is continuous from the initial temperature of TL measurements, then the estimated TL age is of the newest faulting. ii ) If the ED plateau is detected, being continuous in only the higher temperature range, then the estimated TL age is of the past faulting, iii) If the ED plateau cannot be detected in any temperature range at all, then it can be concluded that though the age of faulting cannot be estimated, the fault in question is active.","subitem_description_type":"Abstract"}]},"item_3_full_name_2":{"attribute_name":"著者(ヨミ)","attribute_value_mlt":[{"nameIdentifiers":[{}],"names":[{"name":"ヒラガ, ショウゾウ"}]},{"nameIdentifiers":[{}],"names":[{"name":"モリモト, アキラ"}]}]},"item_3_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{}],"names":[{"name":"HIRAGA, Shozo"}]},{"nameIdentifiers":[{}],"names":[{"name":"MORIMOTO, Akira"}]}]},"item_3_publisher_32":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"奈良教育大学"}]},"item_3_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"05472407","subitem_source_identifier_type":"ISSN"}]},"item_3_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00181070","subitem_source_identifier_type":"NCID"}]},"item_3_version_type_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"平賀, 章三"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"森本, 晃"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-02-27"}],"displaytype":"detail","filename":"NUE50_2_31.pdf","filesize":[{"value":"464.5 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"NUE50_2_31.pdf","url":"https://nara-edu.repo.nii.ac.jp/record/12242/files/NUE50_2_31.pdf"},"version_id":"c7078521-c090-4faf-b201-5059a430da39"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"TL fault dating","subitem_subject_scheme":"Other"},{"subitem_subject":"complete paleodose zeroing","subitem_subject_scheme":"Other"},{"subitem_subject":"ED plateau test","subitem_subject_scheme":"Other"},{"subitem_subject":"層活動年代測定","subitem_subject_scheme":"Other"},{"subitem_subject":"完全ゼロイング","subitem_subject_scheme":"Other"},{"subitem_subject":"EDプラトーテスト","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper"}]},"item_title":"断層活動年代測定における完全ゼロイング検証法　－T L信号強度に対する熱パルス的加熱効果の実験的検討から－","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"断層活動年代測定における完全ゼロイング検証法　－T L信号強度に対する熱パルス的加熱効果の実験的検討から－"}]},"item_type_id":"3","owner":"4","path":["1420"],"pubdate":{"attribute_name":"公開日","attribute_value":"2010-06-10"},"publish_date":"2010-06-10","publish_status":"0","recid":"12242","relation_version_is_last":true,"title":["断層活動年代測定における完全ゼロイング検証法　－T L信号強度に対する熱パルス的加熱効果の実験的検討から－"],"weko_creator_id":"4","weko_shared_id":-1},"updated":"2023-05-15T11:10:32.066551+00:00"}